Magnetometers to improve electron microscopes

Bartington Instruments’ magnetometers are being used to improve the clarity of images produced by electron microscopes, as described in a new case study.The Mag-03IE70v1 and the Mag-03MS70 provide the readings necessary for TMC’s Mag-NetX system to cancel out magnetic fluctuations caused by such factors as the field from a building’s power grid or nearby moving machinery, and hence create a constant field around the microscope that will not interfere with the scanning beam.

TMC has also tested Bartington’s new, low cost Mag690 for the Mag-NetX system, finding that it offers the lowest price for systems requiring suppression of lower frequencies.

The case study describing the operation and evaluation of the sensors can be downloaded here. Contact sales@bartington.com for further information.